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With the rapid proliferation of wireless communication devices and the increasing complexity of embedded systems, ensuring robust and scalable production testing is more critical than ever. This review investigates the role of In-Circuit Emulator (ICE)-based testing software in the manufacturing of wireless terminals, focusing on recent innovations, experimental evaluations, and the integration of AI-driven test orchestration. Comparative studies reveal that ICE-based approaches outperform traditional Automated Test Equipment (ATE) and ICT systems in terms of fault coverage, cost-efficiency, and test time. Moreover, the fusion of ICE platforms with machine learning techniques offers a transformative leap in test optimization, enabling predictive diagnostics and dynamic test sequence adaptation. This paper highlights the evolving landscape of ICE in production environments, identifies existing research gaps, and proposes a future roadmap that integrates AI, edge computing, and digital twins for next-generation test solutions.
Keywords:
In-Circuit Emulator (ICE), Wireless Terminals, Production Testing, Embedded Systems , AI-Orchestrated Testing, Fault Diagnosis, Digital Twins, Edge AI, 5G Device Manufacturing
Cite Article:
"In-Circuit Emulator (ICE) Based Production Testing Software for Wireless Terminals", International Journal of Science & Engineering Development Research (www.ijrti.org), ISSN:2455-2631, Vol.10, Issue 9, page no.a83-a95, September-2025, Available :http://www.ijrti.org/papers/IJRTI2509009.pdf
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ISSN:
2456-3315 | IMPACT FACTOR: 8.14 Calculated By Google Scholar| ESTD YEAR: 2016
An International Scholarly Open Access Journal, Peer-Reviewed, Refereed Journal Impact Factor 8.14 Calculate by Google Scholar and Semantic Scholar | AI-Powered Research Tool, Multidisciplinary, Monthly, Multilanguage Journal Indexing in All Major Database & Metadata, Citation Generator